SV Probe C48-2 Rev A 888008 DAS-2 Motherboard Test Fixture Gold Fingers

SV Probe C48-2 Rev A 888008 DAS-2 Motherboard Test Fixture Gold Fingers

The SV Probe C48-2 is a board-level test fixture designed for functional and in-circuit testing of motherboards and PCB assemblies. Manufactured by SV Probe (copyright 1994), this unit carries part number 888008, revision A, and is identified as device type DAS-2. The fixture features a row of gold-finger edge connectors along one side for interfacing with the device under test, and a circular spring-pin probe contact array — with numbered and lettered pads — for making contact with the board's test points. The PCB is clearly marked with "Probe Side" and "Top Side" orientation labels to guide correct installation.

Specifications & What's Included

• Manufacturer: SV Probe Inc.
• Model: C48-2
• Part Number: 888008
• Revision: Rev A
• Device Type: DAS-2
• S.V. No. (Tracking): 7582
• Date Code: 12-30-97
• Copyright Year: 1994
• Contact Interface: Gold finger edge connectors (multi-pin array along left edge)
• Probe Array: Circular spring-pin contact array with numbered (1–25+) and lettered (A–L) pads
• PCB Orientation Markings: "Probe Side" and "Top Side" silkscreened on board
• Approximate Dimensions: ~4 inches wide x 9 inches in length
• Form Factor: Flat PCB fixture / card format
• Includes: Fixture PCB only; no additional accessories

Applications

SV Probe is a well-known manufacturer of precision probe assemblies and test fixtures for the semiconductor and electronics manufacturing industries. Test fixtures of this type are used during board-level functional testing, in-circuit test (ICT), and device characterization — allowing a test system to make reliable, repeatable electrical contact with a motherboard or PCB assembly's test pads and edge connectors simultaneously. The gold-finger interface connects the fixture to the test system's receiver or handler, while the spring-pin probe array contacts the device under test. Fixtures like the C48-2/DAS-2 were commonly used in semiconductor device assembly and validation workflows during the mid-1990s through the 2000s, particularly in environments where consistent test-point contact pressure and alignment were critical. This type of fixture is still sought after by facilities maintaining legacy test equipment or running compatible test programs.