Probe & Test

Probe&Test C48-1VHT Rev A Probe Card PCB DAS Device Semiconductor Testing 1998

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SKU:
30838
MPN:
C48-IVHT
Condition:
Used
Availability:
Usually ships within 1-2 business days.
Weight:
2.00 LBS
Shipping:
Calculated at Checkout
  • Probe&Test C48-1VHT Rev A probe card PCB front view showing gold cantilever probe array and circular probe ring — full card overview
  • Probe&Test C48-1VHT Rev A label closeup showing model number, revision A, part number 803349, and 1998 copyright
  • Label detail on C48-1VHT probe card showing MR 50% KERF designation, PT#3513, P00391-002, and date codes from October–December 1998
  • Probe&Test C48-1VHT Rev A probe card rear view showing full gold trace layout and circular probe ring from back side
  • Closeup of C48-1VHT radial cantilever probe array showing individually labeled probe fingers arranged in a full circle around the center contact
$150.00
Was: $300.00
Current Stock: 31

Sold Out

Description

Probe&Test C48-1VHT Rev A Probe Card PCB DAS Device Semiconductor Testing 1998

Probe card PCB assembly used in automated semiconductor testing equipment. The radial cantilever probe array makes contact with device under test (DUT) pads for electrical verification during manufacturing and quality assurance.

Specifications & What's Included

  • Model: C48-1VHT Rev A
  • MPN: C48-1VHT (Secondary: 803349)
  • Type: Probe Card PCB with radial cantilever probe array
  • KERF: 50% KERF (MR 50%)
  • Manufacture Date: October–December 1998
  • Serial: 01136B8803000007F
  • Origin: United States

Applications

Probe cards are standard tooling in wafer-level and device-level test systems used by semiconductor manufacturers and test houses. This card was designed for DAS (Device Automation System) test platforms typical of late-1990s production environments. Cantilever probe arrays contact die pads to measure electrical parameters, verify functionality, and identify defects before packaging.

Condition: Used
This Probe&Test C48-1VHT Rev A probe card PCB has been inspected and appears to be in good used condition. The probe fingers and radial cantilever array look intact and undamaged in the photos, with no obvious bent or missing probes visible. The PCB and gold traces show normal handling wear consistent with a used semiconductor test component. Please view our photo set and contact us if you have any questions. Please note: We have multiple units in stock — yours may not be the one shown in the photos, however, it will be similar in condition and function.
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Warranty Information

We stand behind every item we sell with a 30-day money-back guarantee. If your item arrives not as described, you may return it within 30 days for a full refund. Please inspect your purchase upon arrival and contact us with any questions.
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Additional Information

Brand:
Probe&Test
Model:
C48-1VHT
MPN:
C48-1VHT
Secondary Model:
803349
SKU:
30838
Type:
Probe Card PCB
Revision:
Rev A
Application / Use Case:
DAS Device Semiconductor Testing
Probe Configuration:
Radial cantilever probe array
KERF:
50% KERF (MR 50% KERF)
Part Number 1:
P00391 #39
Part Number 2:
P00391-002
PT Number:
PT#3513 9-11-98
PT Reference 2:
PT#3630 10/19/98
Serial / Tracking Number:
01136B8803000007F
Manufacture Date:
1998 (© 1998; labels dated Oct–Dec 1998)
Condition:
Used – Inspected and Tested
Country/Region of Manufacture:
United States
Form Factor:
PCB / Card
Condition Notes:
Probe&Test C48-1VHT Rev A probe card PCB inspected and in good used condition. Probe array appears intact with no visible bent or missing probes. Normal handling wear. Please view photos and contact us with questions.
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Approximate Dimensions:
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Probe Side:
Labeled (Probe Side / Top Side markings on PCB)
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Circular spring-pin probe array, numbered/lettered pads
Condition:
Used – Inspected
Seller Notes:
Unit only; no additional accessories included.
Country/Region of Manufacture:
United States
Condition Notes:
SV Probe C48-2 Rev A 888008 DAS-2 Motherboard Test Fixture. Inspected, in good used condition. PCB clean, gold fingers intact, probe array shows normal wear. ~4" x 9". S.V. No. 7582, dated 12-30-97.
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$125.00
Was: $250.00
110-147C Rev G DAS Device PCB Gold Finger Flex Semiconductor Test BoardDAS (Data Acquisition System) device PCB with gold finger flex ribbon connector designed for semiconductor testing applications...
40098
SKU:
40098
Availability:
Usually ships within 1–2 business days.
Weight:
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Brand:
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MPN:
110-147C
Secondary Model:
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SKU:
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Revision:
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PCB Color:
Teal/Green
Contact Finish:
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Interface Type:
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Application:
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Form Factor:
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Condition:
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Condition Notes:
110-147C Rev G DAS Device PCB. Inspected and in good condition. Pulled from a working semiconductor environment. Gold fingers and radial contact array appear clean and intact. Normal handling wear.