Description
Seiko SFT7000 SFT7300 XRF Coating Thickness Gauge System For Parts
Two-unit X-Ray Fluorescence (XRF) coating thickness measurement system consisting of the SFT7000 controller unit with integrated Sharp CRT monitor and the SFT7300 XRF gauge head. Measures coating and plating thickness on industrial samples using X-ray fluorescence technology.
Specifications & What's Included
- Brand: Seiko Instruments; Model: SFT7000/SFT7300
- Measurement Type: XRF coating and plating thickness
- Motorized XY sample stage with Oriental ED Co. 2-Phase Driver (UD210/UD215)
- Five collimator positions: 0.05x0.4mm, 0.1mm, 0.2mm, 0.3mm
- Integrated Sharp CRT monitor display
- AC 100V power input; X-ray safety labels present
Applications
XRF coating thickness gauges are used in electroplating, PCB manufacturing, semiconductor processing, and thin-film applications to verify coating uniformity and measure plating thickness without sample preparation or destruction. This Seiko system was designed for laboratory and production quality control environments where non-destructive thickness measurement on various substrates is required.
This Seiko SFT7000 SFT7300 XRF Coating Thickness Gauge system is being sold AS-IS for parts or repair. When powered on, the SFT7000 unit beeps once but does not respond to any input. The power supply fan runs when the unit is plugged in. The system is incomplete — some components or internal parts may be missing. This is a large two-unit system; please contact us prior to purchase for a shipping quote. Please view our photo set and contact us if you have any questions.
Warranty Information
Additional Information
Brand: |
Seiko Instruments |
Model: |
SFT7000 |
Secondary Model: |
SFT7300 |
MPN: |
SFT7000 |
Type: |
XRF Coating Thickness Gauge System |
SKU: |
45181 |
Condition: |
As-Is / For Parts or Not Working |
Seller Notes: |
Includes SFT7000 controller/monitor unit and SFT7300 XRF gauge head; system is incomplete |
Country/Region of Manufacture: |
Japan |
Measurement Technology: |
X-Ray Fluorescence (XRF) |
Measurement Type: |
Coating / Plating Thickness |
Application: |
Electroplating, PCB, Semiconductor, Thin Film |
Display: |
Integrated Sharp CRT Monitor |
Stage Type: |
Motorized XY Sample Stage |
Stage Driver: |
Oriental ED Co. 2-Phase Driver UD210 / UD215 |
Collimator Sizes: |
0.05x0.4mm, 0.1mm, 0.2mm, 0.3mm, 0.1mm (5 positions) |
Rear Connectors (SFT7300): |
X-RAY (circular), STAGE (circular + DB15), Detector Out (BNC), X-Ray Alarm |
Rear Connectors (SFT7000): |
CONTROLLER (DB25), SAMPLE STAGE (circular), CRT (AC 100V), AC IN, FUSE |
Internal Board: |
Seiko Instruments X Ray Power Protection 159-07A |
Form Factor: |
Freestanding Floor Console, Two-Unit System |
X-Ray Warning: |
Yes — X-RAY caution labels present on unit |
Power Input: |
AC 100V (CRT); additional AC input on SFT7000 rear panel |
Condition Notes: |
Seiko SFT7000 XRF Coating Thickness Gauge — AS-IS, for parts or repair. Beeps once on power-up, no input response. Fan operates. Unit is incomplete. Contact us for shipping quote before purchasing. |