Test Point 1 2003C Accuprobe Semiconductor IC Test Probe Fixture 8oz Spring Pins

Test Point 1 2003C Accuprobe Semiconductor IC Test Probe Fixture 8oz Spring Pins

The Test Point 1 2003C is an Accuprobe-brand clamshell semiconductor IC test probe fixture designed for functional in-circuit or burn-in testing of integrated circuits. The fixture uses a hinged clamshell lid that brings the probe head array down onto a device under test (DUT) placed in the base, making repeatable, low-force electrical contact across multiple IC pads simultaneously. Per the nameplate, this unit was configured with both 8oz serrated and 8oz slotted pyramid spring pins along with.139-inch tooling pins for device alignment.

Specifications & What's Included

• Brand: Test Point 1 (138 Charcot Ave, San Jose, CA 95131)
• Model: 2003C
• PCB Assembly: OMA 2
• Manufacture Date: July 12, 1990
• Probe Type 1: 8oz Serrated spring pins
• Probe Type 2: 8oz Slotted Pyramid spring pins
• Tooling Pins:.139 in. (device alignment)
• Form Factor: Clamshell / benchtop fixture with hinged lid
• Internal wiring: dense multicolor wire harness connecting probe array to base PCB
• Construction: black anodized aluminum housing, white probe-bed frame
• Fixture only — cables and external interface hardware not included

Applications

Clamshell IC test probe fixtures like the Test Point 1 Accuprobe 2003C are used in semiconductor manufacturing and quality-assurance workflows to make fast, repeatable contact with packaged integrated circuits for functional test, parametric measurement, or burn-in screening. The spring-pin (pogo-pin) probe array contacts the IC's leads or pads simultaneously without soldering, allowing a device to be tested and released undamaged. Test Point 1 was a San Jose, California-based manufacturer active in the late 1980s and early 1990s — the heart of Silicon Valley's semiconductor production era — supplying custom probe fixtures to IC manufacturers, contract electronics manufacturers, and semiconductor test labs. These fixtures are still sought by facilities maintaining older automated test equipment (ATE) setups or needing custom probe solutions for legacy IC packages. The serrated and slotted pyramid spring-pin configurations visible on this unit are suited for making reliable contact on flat or slightly oxidized lead surfaces.