Description
Camtek Falcon PD 200mm Optical Wafer Inspection System Basler A201b Camera
Floor-standing optical inspection system for 200mm semiconductor wafers. Uses brightfield and darkfield imaging to detect surface defects and process anomalies during wafer manufacturing.
Specifications & What's Included
- Basler A201b monochrome camera (1 MP, 1008×1018 pixels)
- Three computers connected via umbilical interface
- ACSTech80 SB 1381 motion control module
- Digital current loop illumination controller
- Enviro HEPA filter (650 CFM)
- Power: 220V AC, 50/60 Hz
- Maximum wafer size: 200mm
- Floor-standing multi-cabinet system on casters
- Manufactured: Week 46, 2005
Applications
Designed for semiconductor manufacturing quality control, this system inspects 200mm wafers for defects including particulates, scratches, and process-related anomalies. Brightfield and darkfield modes address different defect types and surface characteristics. Historically deployed in fabs and inspection facilities for in-process and final wafer screening.
This Camtek Falcon PD 200mm Optical Wafer Inspection System is being sold as-is and has not been fully tested. The system is a complex, multi-cabinet semiconductor inspection platform, and a complete functional test is beyond what we are able to perform at our facility. We cannot confirm the operational status of the inspection optics, motion stages, cameras, or control software. The system appears physically complete with the Basler A201b camera, three integrated computers, illumination and motion control electronics, HEPA filter unit, and associated cabling all present and visible. This item requires freight shipping — please contact us for a shipping quote, to arrange local pickup, or to schedule a viewing at our facility before purchasing. Please view our photo set and contact us if you have any questions.
Warranty Information
Additional Information
Brand: |
Camtek |
Model: |
Falcon PD |
MPN: |
Falcon PD |
Type: |
Optical Wafer Inspection System |
SKU: |
46801 |
Condition: |
As-Is / For Parts or Not Working |
Seller Notes: |
Includes Basler A201b camera, 3 computers w/ umbilical, HEPA filter 650 CFM |
Country/Region of Manufacture: |
Israel |
Power Requirements: |
220V AC, 50/60 Hz |
Maximum Wafer Size: |
200 mm |
Camera Model: |
Basler A201b (monochrome) |
Camera Resolution: |
1 MP, 1008(H) x 1018(V) pixels |
Manufacture Date: |
Week 46, 2005 |
HEPA Filter: |
Enviro HEPA filter, 650 CFM |
Number of Computers: |
3 (connected via umbilical) |
Motion Controller: |
ACSTech80 SB 1381 Universal Motion Control Module |
Illumination Controller: |
Digital Current Loop controller module |
Inspection Type: |
Brightfield and Darkfield optical inspection |
Application: |
200mm semiconductor wafer defect inspection |
Form Factor: |
Floor-standing multi-cabinet system on casters |
Compatible Wafer Size: |
Up to 200 mm |
Condition Notes: |
Camtek Falcon PD 200mm Wafer Inspection System sold as-is, not fully tested. Complex multi-cabinet system; functional status of optics, stages, and controls unconfirmed. Freight shipping required — contact us for quote or to arrange viewing. |