Ailtech

Ailtech 94456-3 ETS-Lindgren EMI Current Probe N-Type RF Test Clamp

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SKU:
53407
MPN:
94456-3
Condition:
Used
Availability:
In stock and ready to ship within 1-2 business days.
Weight:
3.00 LBS
Shipping:
Calculated at Checkout
  • Ailtech 94456-3 EMI current probe front view showing hinged clamp housing and N-type connector flange
  • Ailtech 94456-3 probe open position displaying large round split-core aperture and internal clamp mechanism
  • Close-up of N-type RF connector mounted on four-screw flange at top of probe housing
  • Nameplate detail showing Ailtech, model 94456-3, Eaton Corporation Electronic Instrumentation Division markings
  • Rear view of probe showing hinge assembly, latch clasp, and black textured finish with metal hardware
  • Probe closed position demonstrating hinged clamp latching mechanism and overall profile
  • Side profile of probe showing aperture opening size and housing depth
  • Close-up of metal hinge and latch hardware showing condition and fit
  • Full probe assembly at angle showing complete geometry and connector orientation
$700.00
Was: $1,500.00
Current Stock: 1

Sold Out

Description

Ailtech 94456-3 ETS-Lindgren EMI Current Probe N-Type RF Test Clamp

The Ailtech 94456-3 is a hinged, clamp-on current probe designed for EMI and EMC testing. The probe opens and closes around a conductor or cable without breaking the circuit, allowing RF current to be sensed and transmitted to a measuring instrument via its N-type connector. This split-core design with large round center aperture is part of the RF current probe family now marketed by ETS-Lindgren, the successor entity to Ailtech/Eaton's Electronic Instrumentation Division.

Specifications & What's Included

  • Make: Ailtech (Eaton Corporation, Electronic Instrumentation Division)
  • Model/Part Number: 94456-3
  • Type: Clamp-on RF/EMI current probe
  • Design: Hinged split-core housing with manual latch clasp
  • Output Connector: N-type RF connector on four-screw mounting flange
  • Aperture: Large 4 inch ID round center opening for conductor access
  • Housing: Black textured composite material with metal hinge and latch hardware
  • Nameplate: Engraved metal identification plate with model and serial number
  • Country of Origin: United States
  • Included: Probe only; no cables, coaxial connectors, carrying case, manual, or other accessories

Applications

Clamp-on EMI/EMC current probes of this type are used in electromagnetic compatibility testing, electromagnetic interference (EMI) diagnostics, and RF measurement applications where non-invasive current sensing is required.

  • EMI/EMC Testing: Detection and measurement of radiated and conducted emissions in electronic equipment and systems under test; used in pre-compliance and compliance testing labs
  • RF Current Measurement: High-frequency current sensing on cables, conductors, and power leads without breaking circuit continuity
  • Instrumentation Coupling: Direct connection to spectrum analyzers, EMI receivers, oscilloscopes, and RF power meters via the N-type connector for real-time current analysis
  • Cable and Harness Testing: Measurement of leakage current and RF coupling effects on shielded and unshielded conductors in telecommunications and aerospace applications
  • Legacy Equipment Diagnostics: Still widely used in maintenance and troubleshooting of older RF and microwave test systems where compatible probes are required
Condition: Used
This Ailtech 94456-3 EMI current probe has been visually inspected and appears to be in good used condition. The black textured housing shows typical scuffs and light paint wear on the edges from previous use. The N-type connector flange exhibits light tarnish and surface oxidation consistent with age and handling. The hinged split-core clamp mechanism is intact with hinge and latch in place and functioning. The large aperture is clear and accessible. Please view our photo set and contact us if you have any questions.
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Warranty Information

We stand behind every item we sell with a 30-day money-back guarantee. If your item arrives not as described, you may return it within 30 days for a full refund. Please inspect your purchase upon arrival and contact us with any questions.
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Additional Information

Brand:
Ailtech / Eaton Corporation
Model:
94456-3
MPN:
94456-3
Type:
Clamp-On EMI Current Probe
SKU:
53407
Manufacturer:
Eaton Corporation, Electronic Instrumentation Division
Connector Type:
N-Type (4-screw flange mount)
Form Factor:
Hinged Split-Core Clamp-On
Color:
Black
Country/Region of Manufacture:
United States
Seller Notes:
Probe only—no cables, case, manual, or other accessories included
Condition Notes:
Ailtech 94456-3 EMI current probe, used condition. Visually inspected; black housing shows scuffs and paint wear; connector flange has light tarnish/oxidation. Clamp mechanism intact. No testing performed. Probe only—no cables, case, or manual.
Aperture Design:
Large round center opening
Housing Material:
Black textured composite with metal latch/hinge
Condition:
Used
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30838
SKU:
30838
Availability:
Usually ships within 1-2 business days.
Weight:
2.00 LBS
Brand:
Probe&Test
Model:
C48-1VHT
MPN:
C48-1VHT
Secondary Model:
803349
SKU:
30838
Type:
Probe Card PCB
Revision:
Rev A
Application / Use Case:
DAS Device Semiconductor Testing
Probe Configuration:
Radial cantilever probe array
KERF:
50% KERF (MR 50% KERF)
Part Number 1:
P00391 #39
Part Number 2:
P00391-002
PT Number:
PT#3513 9-11-98
PT Reference 2:
PT#3630 10/19/98
Serial / Tracking Number:
01136B8803000007F
Manufacture Date:
1998 (© 1998; labels dated Oct–Dec 1998)
Condition:
Used – Inspected and Tested
Country/Region of Manufacture:
United States
Form Factor:
PCB / Card
Condition Notes:
Probe&Test C48-1VHT Rev A probe card PCB inspected and in good used condition. Probe array appears intact with no visible bent or missing probes. Normal handling wear. Please view photos and contact us with questions.
California Prop 65 Warning:
WARNING: This product can expose you to chemicals including lead and lead compounds, and DEHP (a phthalate), which are known to the State of California to cause cancer and birth defects or other reproductive harm. Go to P65Warnings.ca.gov