Description
Accuprobe D2HB7B3 Dual D-Type Probe Card Probe BeCu Long Standard Tip 15 mil
The Accuprobe D2HB7B3 is a Dual D-Type probe designed for use with probe cards in semiconductor wafer testing applications. It features a beryllium copper (BeCu) needle mounted in a long-style D-blade holder, and is part of Accuprobe's standardized probe naming system where each character in the part number encodes a specific dimensional or material specification. This probe is lead-free and RoHS compliant, as indicated on the original packaging.
Specifications & What's Included
- Part Number: D2HB7B3
- Probe Configuration: Dual D-Type
- Blade Type: Standard (D)
- Holder Style: Long (2)
- Holder Length: 1.720" (43.688 mm)
- Needle Material: Beryllium Copper — BeCu (HB)
- Needle Diameter: 15 mils (0.381 mm)
- Tip Diameter: 0.005" (0.127 mm) (7)
- Tip Drop "B": 0.015" (0.381 mm)
- Tip Depth "D": 0.324" (8.230 mm)
- Tip Extension "L1": 0.350" (8.89 mm)
- Overall Assembly Length: 0.900" (22.86 mm)
- Compliance: Lead-Free / RoHS Compliant
- Includes: Single probe and original Accuprobe packaging box
Applications
Accuprobe D-type probe card probes are used in semiconductor wafer-level electrical testing, where probe cards make direct contact with the bond pads or test pads of integrated circuits on a wafer before dicing. The D-type blade design clamps the needle at a precise angle and position relative to the probe card ring, allowing repeatable, accurate touchdown on very small contact pads. BeCu needles are a long-established choice in this application — the material offers a good combination of spring compliance, electrical conductivity, and wear resistance at fine tip diameters. Long-holder configurations like this one are used when the probe card geometry or device pad layout requires greater reach from the blade attachment point to the pad. These probes are standard consumables in semiconductor IC test environments, used in both production wafer sort and engineering characterization on manual, semi-automatic, and fully automatic probe stations.
This Accuprobe D2HB7B3 Dual D-Type Probe Card Probe has been inspected and is in good condition. The probe shows normal handling wear consistent with prior use or storage. The gold blade holder and BeCu needle appear intact with no visible damage to the tip or body. The original packaging box is also included. Please view our photo set and contact us if you have any questions. Please note: We have multiple units in stock — yours may not be the one shown in the photos, however, it will be similar in condition and function.
Warranty Information
Additional Information
Brand: |
Accuprobe |
Model: |
D2HB7B3 |
MPN: |
D2HB7B3 |
Type: |
Dual D-Type Probe Card Probe |
SKU: |
51721 |
Blade Type: |
Standard (D-Type) |
Holder Length: |
Long – 1.720" (43.688 mm) |
Needle Material: |
Beryllium Copper (BeCu) |
Needle Diameter: |
15 mils (0.381 mm) |
Tip Diameter: |
0.005" (0.127 mm) |
Tip Drop (B): |
0.015" (0.381 mm) |
Tip Depth (D): |
0.324" (8.230 mm) |
Tip Extension L1: |
0.350" (8.89 mm) |
Overall Length: |
0.900" (22.86 mm) |
RoHS Compliance: |
Lead-Free / RoHS Compliant |
Compatible With: |
Probe Cards – D-Type Blade Configuration |
Application: |
Semiconductor Wafer Probing / IC Testing |
Condition: |
Used – Inspected and in Good Condition |
Seller Notes: |
Listing is for a single probe. Inspected and in good condition. |
Country/Region of Manufacture: |
United States |
Condition Notes: |
Accuprobe D2HB7B3 Dual D-Type BeCu probe card probe. Inspected and in good condition. Normal handling wear. BeCu needle and gold blade holder intact. Original box included. |
