Veeco OSP Overhead Scanning Profiler Surface Metrology System For Parts

Veeco OSP Overhead Scanning Profiler Surface Metrology System For Parts

The Veeco OSP (Overhead Scanning Profiler) is a large-format surface metrology instrument designed for non-contact measurement of surface topography, roughness, and step heights across wide-area substrates. The OSP platform uses an overhead gantry architecture, positioning the measurement head above the sample stage to scan surfaces from above — a configuration well suited to large flat substrates such as semiconductor wafers, flat panel display glass, and optical components. This unit is being sold AS-IS for parts or repair and is not tested or guaranteed to be functional.

Specifications & What's Included

• Make: Veeco
• Model: OSP (Overhead Scanning Profiler)
• Architecture: Overhead gantry scanning frame with enclosed measurement enclosure
• Motion system: Newport precision motion stages visible in lower electronics bay
• Lower bay: Open electronics chassis with Newport motion controller boards, pneumatic manifold, and associated tubing/wiring visible
• Enclosure: White painted steel gantry frame and side panels — appears intact
• Mounting: Unit is currently sitting on a wooden shipping pallet
• Measurement types (designed for): Surface roughness, step height, surface topography
• Sold AS-IS for parts or repair — not tested, no functionality guaranteed

Applications

Veeco OSP Overhead Scanning Profiler systems were used in research and production environments requiring large-area, non-contact surface characterization. Typical deployment contexts include semiconductor device fabrication (wafer surface and thin-film measurement), flat panel display manufacturing, advanced optics and photonics fabrication, and surface science research in materials and nanotechnology laboratories. The overhead gantry configuration allows measurement of substrates that are difficult to scan with conventional stage-mounted profilometers, making the OSP platform particularly relevant to R&D and metrology groups working with large or fragile samples. Parts and sub-assemblies from this type of instrument — including Newport motion stages, electronics controllers, and enclosure components — are sought by labs repairing or building similar precision motion and metrology systems.

Please note: We may have multiple units of this item in stock. The unit you receive may vary slightly from the one shown in the photos. All units are functionally equivalent and inspected to the same standard.