Sun Systems EC127 Temperature Test Chamber -30 to +200C 2.7 CF GPIB RS-232

Sun Systems EC127 Temperature Test Chamber -30 to +200C 2.7 CF GPIB RS-232

The Sun Electronic Systems EC127 is a 2.7 cubic foot benchtop temperature test chamber capable of cycling from -30°C to +200°C under programmable PID control. It is designed for compatibility with the LabVIEW Instrument Driver set and supports GPIB, RS-232/RS-422, and analog interfaces for full remote automation. The EC127 uses a pulse-width-modulated heating system and a mechanical refrigeration system to achieve controlled thermal ramp rates in both directions.

Specifications & What's Included

• Model: Sun Electronic Systems EC127, Rev O
• Chamber Volume: 2.7 cu ft
• Test Chamber Dimensions: 20.0"W × 12.0"H × 19.0"D (50.8 × 30.48 × 48.26 cm)
• Overall Dimensions: 26.0"W × 30.0"H × 36.0"D (66 × 76.2 × 91.44 cm)
• Temperature Setpoint Range: -30°C to +200°C
• Time at Temperature Range: 1.0 sec to 99 hrs 59 min 59 sec, or continuous
• Temperature Ramping: Locally controlled from 0.01°C/min up to the specified max rate of change
• Temperature Control: PID Algorithm / Pulse Width Modulated, fully programmable
• Programmable Loop Control: 1 to 65,535 FOR/NEXT loop executions across 10 loops; nesting supported
• Programmable Set Temps & Times: Limited only by available program memory (typically 100+ segments)
• Temperature Uniformity (105–125 VAC): ±0.1°C
• Heat Rate of Change (empty chamber): +25°C to +100°C in 15 min; to +120°C in 21 min; to +150°C in 30 min; to +200°C in 30 min
• Cool Rate of Change (empty chamber): +25°C to +5°C in 4 min; to 0°C in 6 min; to -10°C in 11 min; to -25°C in 25 min; to -30°C in 38 min
• Active Load Capacity: 100W device under test (DUT) loading at -20°C
• Air Flow: 300 CFM, vertical
• Power Supply: 110/115 VAC, 15A, 50/60 Hz
• Power Requirement: 1,650 Watts
• Interfaces: GPIB, RS-232/RS-422, Analog output, Optional Printer port
• Software Compatibility: LabVIEW Instrument Driver set
• Front Panel: Alphanumeric keypad, green alphanumeric display, Output Enable keys, Air CTL and RH CTL output indicators
• Included: Chamber unit only — no manual or peripherals

Applications

The Sun Systems EC127 is used in electronics manufacturing, aerospace, defense, and R&D labs for thermal screening, environmental stress screening (ESS), and accelerated life testing of components and assemblies. Temperature test chambers of this type subject a device under test (DUT) to controlled temperature cycles to expose latent defects, verify operational margins, and qualify products for military, automotive, or commercial standards. The GPIB and RS-232/RS-422 interfaces make chambers like the EC127 well-suited for automated test systems, allowing a host controller or LabVIEW-based ATE setup to sequence temperature profiles, log data, and coordinate DUT measurements without manual intervention. Sun Electronic Systems, based in Titusville, Florida, has produced thermal test chambers for the semiconductor, aerospace, and defense industries since the 1970s; the EC127 dates from the late 1990s based on its nameplate date of 1999.