Description
G0059 Probe Card for Electroglas Wafer Prober Gold Finger Semiconductor Test
Probe card designed for use with Electroglas wafer prober systems. Used for semiconductor wafer testing and IC probing applications, interfacing between the test handler and the device under test.
Specifications & What's Included
- Model: G0059
- Type: Probe Card with Circular Gold Finger Array
- Substrate: Yellow Fiberglass
- Connectors: 4x SMA Gold-plated
- Date Code: 11/99
- Compatible With: Electroglas Wafer Prober
Applications
Probe cards are critical components in semiconductor testing, establishing electrical connections between test equipment and wafers during parametric and functional testing. This card was used in Electroglas prober systems, which were standard equipment in semiconductor manufacturing and test facilities for wafer-level device characterization. The gold finger array accommodates multiple test points across the wafer surface.
Condition: Used
This G0059 Gold Finger Probe Card for Electroglas wafer probers has been inspected and is in good used condition. It was pulled from a working environment where it was in active use. The yellow fiberglass substrate is intact with no visible cracks or delamination. The circular gold finger probe array and radial trace routing appear clean and undamaged. All four gold-plated SMA connectors on the aluminum mounting bar are present and show no signs of damage. Minor handling wear is consistent with normal use in a semiconductor test environment. Please view our photo set and contact us if you have any questions. Please note: We have multiple units in stock — yours may not be the one shown in the photos, however, it will be similar in condition and function.
This G0059 Gold Finger Probe Card for Electroglas wafer probers has been inspected and is in good used condition. It was pulled from a working environment where it was in active use. The yellow fiberglass substrate is intact with no visible cracks or delamination. The circular gold finger probe array and radial trace routing appear clean and undamaged. All four gold-plated SMA connectors on the aluminum mounting bar are present and show no signs of damage. Minor handling wear is consistent with normal use in a semiconductor test environment. Please view our photo set and contact us if you have any questions. Please note: We have multiple units in stock — yours may not be the one shown in the photos, however, it will be similar in condition and function.
Warranty Information
We stand behind every item we sell with a 30-day money-back guarantee. If your item arrives not as described, you may return it within 30 days for a full refund. Please inspect your purchase upon arrival and contact us with any questions.
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Additional Information
Brand: |
Unbranded |
Model: |
G0059 |
MPN: |
G0059 |
Type: |
Probe Card |
SKU: |
30857 |
Compatible With: |
Electroglas Wafer Prober |
Application: |
Semiconductor Wafer Testing / IC Probing |
Substrate Color: |
Yellow Fiberglass |
Connector Type: |
SMA (Gold-plated) |
Number of SMA Connectors: |
4 |
Probe Array Style: |
Circular / Radial Gold Finger Array |
Date Code: |
11/99 |
Condition: |
Used – Pulled from Working Environment |
Seller Notes: |
Pulled from a working environment. Inspected and in good condition. |
Condition Notes: |
G0059 Gold Finger Probe Card for Electroglas wafer prober. Inspected and in good used condition. Pulled from a working environment. Substrate intact, SMA connectors present, probe array clean. |