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Binocular

Binocular Microscope Head Block Adjustable Eyepieces IPD Scale Wafer Prober

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SKU:
46495
MPN:
Microscope
Condition:
Used
Availability:
Usually ships within 1–2 business days.
Weight:
5.00 LBS
Shipping:
Calculated at Checkout
  • Binocular microscope head block with two adjustable eyepiece tubes and swivel photo port — front-left angled view
  • Binocular microscope head block showing top swivel ring mount and dual eyepiece ports — rear-left angled view
  • Top-down view of binocular microscope head block showing large circular swivel ring with internal optics and central aperture
  • Side profile of binocular microscope head block showing angled body, eyepiece tubes, and swivel photo port
  • Front face of binocular microscope head block showing dual eyepiece openings and IPD interpupillary scale reading 68–73mm
  • Close-up of IPD interpupillary distance scale on microscope head block, graduated 68 69 70 71 72 73 mm with red indicator at 71
  • Close-up of swivel photo/camera port on top of microscope head block showing internal beamsplitter prism and knurled locking screw
$100.00
Was: $200.00
Current Stock: 1

Sold Out

Description

Binocular Microscope Head Block Adjustable Eyepieces IPD Scale Wafer Prober

Binocular microscope head block assembly designed for semiconductor wafer inspection and probing applications. Features two adjustable eyepiece tubes with interpupillary distance (IPD) adjustment range of 68–73 mm, plus a swivel photo port with internal beamsplitter prism for camera attachment.

Specifications & What's Included

  • Head Type: Binocular with 2 adjustable eyepiece tubes
  • IPD Range: 68–73 mm
  • Swivel photo port with beamsplitter prism
  • Matte black cast body
  • Compatible with Rucker & Kolls 682 Semi-Auto Wafer Prober
  • Head block only; eyepieces not included

Applications

This head block type is used in semiconductor wafer probing stations and inspection microscopy systems for magnified visual examination of wafer surfaces, probe contact points, and device features. The Rucker & Kolls 682 is a standard semi-automated wafer prober platform used in semiconductor testing and failure analysis. The dual eyepieces support simultaneous observation, while the photo port accommodates high-resolution imaging documentation of wafer conditions and probe alignment.

Condition: Used
This binocular microscope head block has been inspected and is in good used condition. It was pulled from a working Rucker & Kolls 682 Semi-Automatic X/Y Wafer Prober where it was in active use. The cast black body shows light surface wear typical of lab use, and the eyepiece tubes and swivel photo port are intact and free of visible damage. The IPD scale and internal beamsplitter prism are present and appear undamaged in the photos. Please view our photo set and contact us if you have any questions.
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Warranty Information

We stand behind every item we sell with a 30-day money-back guarantee. If your item arrives not as described, you may return it within 30 days for a full refund. Please inspect your purchase upon arrival and contact us with any questions.
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Additional Information

Brand:
Unbranded
Model:
Binocular Microscope Head Block
Type:
Binocular Microscope Head Block
SKU:
46495
Condition:
Used – Pulled from Working Environment
Head Type:
Binocular
IPD Range:
68–73 mm
Eyepiece Ports:
2 adjustable eyepiece tubes
Additional Port:
1 swivel/photo port with beamsplitter prism
Beamsplitter:
Internal prism beamsplitter, swivel-adjustable
Body Finish:
Matte black cast body
Compatible With:
Rucker & Kolls 682 Semi-Auto Wafer Prober
Application:
Semiconductor wafer probing, inspection microscopy
Seller Notes:
Head block only; no eyepieces included. Pulled from R&K 682 wafer prober.
Form Factor:
Benchtop / Component
Condition Notes:
Used binocular microscope head block pulled from a working Rucker & Kolls 682 wafer prober. Inspected and in good condition. Light surface wear; optics and swivel port intact. Please view photos and contact us with questions.
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