Amray 1860 FE-SEM w/Kevex Superdry EDS & Digital Imaging - As Is
SEM/EDS: Scanning Electron Microscope with Energy Dispersive Spectrometry. The SEM was in daily use until a few years ago when their process moved to another method and has been sitting idle for a few years. It will need service to bring it up to usable condition. Schottky Field Emission Gun gives >3nm Resolution 150mm - 6 Inch - Wafer Navigation Sensitive to Elements down to Carbon Analysis Area down to 0.1mm Sensitivity ~1 at % Sample Accommodates 150 mm - 6 Inch - Wafers and Smaller Samples Applications:
Wafer Inspection or a Laboratory SEM Failure Analysis: Cross-Section and Plan-View Examination Compositional Microanalysis and Mapping Devices from Data Storage, MEMS, Semiconductor and Related
Condition: Used
This item has been inspected and appears to be in good condition